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SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Characterization of Very High Speed Semiconductor Devices and Integrated Circuits - Simple And Inexpensive Method For Testing High Speed Semiconductor Devices Using Electro-Optics Sampling
Forsyth, K. W., Jones, R. S., Lindemuth, J. R., Jain, Ravinder K.Volume:
795
Year:
1988
Language:
english
DOI:
10.1117/12.940956
File:
PDF, 172 KB
english, 1988