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SPIE Proceedings [SPIE 1985 Los Angeles Technical Symposium - Los Angeles (Monday 21 January 1985)] Spectroscopic Characterization Techniques for Semiconductor Technology II - Faraday Rotation And Ellipticity In Silicon Mosfets: Properties Of Tne 2D Electron Gas
Piller, Herbert, Pollak, Fred H., Tsu, RaphaelVolume:
524
Year:
1985
Language:
english
DOI:
10.1117/12.946325
File:
PDF, 456 KB
english, 1985