[IEEE 2016 International Symposium on VLSI Technology,...

  • Main
  • [IEEE 2016 International Symposium on...

[IEEE 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2016.4.25-2016.4.27)] 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Investigation of local heating effect for 14nm Ge pFinFETs based on Monte Carlo method

Yin, Longxiang, Jiang, Hai, Shen, Lei, Wang, JunCheng, Du, Gang, Liu, Xiaoyan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
DOI:
10.1109/VLSI-TSA.2016.7480514
File:
PDF, 2.90 MB
english, 2016
Conversion to is in progress
Conversion to is failed