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[IEEE 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2016.4.25-2016.4.27)] 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Investigation of local heating effect for 14nm Ge pFinFETs based on Monte Carlo method
Yin, Longxiang, Jiang, Hai, Shen, Lei, Wang, JunCheng, Du, Gang, Liu, XiaoyanYear:
2016
Language:
english
DOI:
10.1109/VLSI-TSA.2016.7480514
File:
PDF, 2.90 MB
english, 2016