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SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Polarization Analysis and Measurement - Refractive-index and thickness measurements for an anisotropic film by S- and P-polarized reflectances
Kihara, Tami, Yokomori, Kiyoshi, Goldstein, Dennis H., Chipman, Russell A.Volume:
1746
Year:
1992
Language:
english
DOI:
10.1117/12.138796
File:
PDF, 444 KB
english, 1992