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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Imaging Spectrometry XVIII - Behavioral model and simulator for the Multi-slit Optimized Spectrometer (MOS)
Tufillaro, Nicholas, Davis, Curtiss O., Valle, Tim, Good, William, Stephens, Michelle, Spuhler, Peter, Mouroulis, Pantazis, Pagano, Thomas S.Volume:
8870
Year:
2013
Language:
english
DOI:
10.1117/12.2023526
File:
PDF, 716 KB
english, 2013