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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII - Characterization of Si hybrid CMOS detectors for use in the soft x-ray band

Prieskorn, Zachary R., Griffith, Christopher V., Bongiorno, Stephen D., Falcone, Abraham D., Burrows, David N., Siegmund, Oswald H.
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Volume:
8859
Year:
2013
Language:
english
DOI:
10.1117/12.2024259
File:
PDF, 545 KB
english, 2013
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