SPIE Proceedings [SPIE SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics - Orlando, FL (Monday 17 April 1995)] Smart Focal Plane Arrays and Focal Plane Array Testing - Characterization of post-correction uniformity on infrared focal plane arrays
O'Neill III, John J., Costanzo, Christopher R., Kaplan, David R., Wigdor, Marc, Massie, Mark A.Volume:
2474
Year:
1995
Language:
english
DOI:
10.1117/12.210556
File:
PDF, 233 KB
english, 1995