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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Optical Manufacturing and Testing - Analysis of the fundamental measuring error of aspherical surface by shearing interferometer
Xin, Qiming, Gao, Yun, Zeng, Yuanhui, Doherty, Victor J., Stahl, H. PhilipVolume:
2536
Year:
1995
Language:
english
DOI:
10.1117/12.218417
File:
PDF, 182 KB
english, 1995