SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Detectors, Focal Plane Arrays, and Imaging Devices II - Defects in HgCdTe crystals grown by SSR technique
Wang, Yue, Li, Quanbao, Han, Qingling, Song, Bingwen, Jie, Wanqi, Zhou, Yaohe, Liang, Pingzhi, Wigdor, Marc, Frederick, William G. D.Volume:
3553
Year:
1998
Language:
english
DOI:
10.1117/12.318058
File:
PDF, 1.95 MB
english, 1998