SPIE Proceedings [SPIE International Conference on Optical Metrology - Pultusk Castle, Poland (Wednesday 20 October 1999)] Interferometry '99: Techniques and Technologies - Illumination systems using photopolymer gratings for speckle interferometry
Whelan, Maurice P., Forno, Colin, Martin, Suzanne, O'Neill, Feidhlim T., Toal, Vincent, Kujawinska, Malgorzata, Takeda, MitsuoVolume:
3744
Year:
1999
Language:
english
DOI:
10.1117/12.357758
File:
PDF, 1.17 MB
english, 1999