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SPIE Proceedings [SPIE International Conference on Sensors and Control Techniques (ICSC2000) - Wuhan, China (Monday 19 June 2000)] International Conference on Sensors and Control Techniques (ICSC 2000) - Influence of process variables on the microstructure and electrical properties of low-voltage ZnO varistor
Zhang, Congchun, Zhou, Dong-xiang, Gong, Shuping, Jiang, Desheng, Wang, AnboVolume:
4077
Year:
2000
Language:
english
DOI:
10.1117/12.385530
File:
PDF, 833 KB
english, 2000