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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Devices and Diagnostics in Materials Science - Chemical imaging with scanning near-field infrared microscopy and spectroscopy
Michaels, Chris A., Richter, Lee J., Cavanagh, Richard R., Stranick, Stephan J., Andrews, David L., Asakura, Toshimitsu, Jutamulia, Suganda, Kirk, Wiley P., Lagally, Max G., Lal, Ravindra B., TrolingeVolume:
4098
Year:
2000
Language:
english
DOI:
10.1117/12.401616
File:
PDF, 1.71 MB
english, 2000