SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - Fusion in frequency-domain of instantaneous laser assistant vision image and low-light-level image
Sun, Shaoyuan, Wang, Liping, Zhang, Baomin, Zhang, Shulian, Gao, WeiVolume:
4222
Year:
2000
Language:
english
DOI:
10.1117/12.403890
File:
PDF, 270 KB
english, 2000