SPIE Proceedings [SPIE Photonics West 2001 - Electronic...

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SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Machine Vision Applications in Industrial Inspection IX - Real-time inspection of metal laminates by means of CNNs

Preciado, Victor M., Guinea, Domingo, Montufar-Chaveznava, Rodrigo, Vicente, Jose, Hunt, Martin A.
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Volume:
4301
Year:
2001
Language:
english
DOI:
10.1117/12.420920
File:
PDF, 77 KB
english, 2001
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