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SPIE Proceedings [SPIE International Symposium on Photonics and Applications - Singapore, Singapore (Monday 26 November 2001)] Advanced Photonic Sensors and Applications II - Active industrial surface inspection with the inverse projected-fringe technique
Kalms, Michael K., Osten, Wolfgang, Jueptner, Werner P. O., Asundi, Anand K., Osten, Wolfgang, Varadan, Vijay K.Volume:
4596
Year:
2001
Language:
english
DOI:
10.1117/12.447369
File:
PDF, 1.42 MB
english, 2001