SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - Nanoscale nondestructive evaluation of materials and devices by ultrasonic atomic force microscopy
Yamanaka, Kazushi, Tsuji, Toshihiro, Irihama, Hiroshi, Mihara, Tsuyoshi, Meyendorf, Norbert, Baaklini, George Y., Michel, BerndVolume:
5045
Year:
2003
Language:
english
DOI:
10.1117/12.483823
File:
PDF, 433 KB
english, 2003