SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Applying the idea of SAFER to develop a new automatic test system
Li, Wen, Xiao, Kai, Gui, Xianzhou, Zhang, Guangjun, Zhao, Huijie, Wang, ZhongyuVolume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521901
File:
PDF, 106 KB
english, 2003