![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Methods for Arts and Archaeology - NRC's 3D technology for museum and heritage applications
Wei, William, Salimbeni, Renzo, Pezzati, Luca, de Tagle, Alberto, Hummelen, IJsbrandVolume:
5857
Year:
2005
Language:
english
DOI:
10.1117/12.612247
File:
PDF, 762 KB
english, 2005