SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Application of the photoelastic tomography to three-dimensional measurement of birefringence in anisotropic microobjects
Kniazewski, Pawel, Duparr½Á, Angela, Singh, Bhanwar, Kozacki, Tomasz, Kujawinska, Malgorzata, Gu, Zu-HanVolume:
5878
Year:
2005
Language:
english
DOI:
10.1117/12.613044
File:
PDF, 208 KB
english, 2005