SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Polarization Science and Remote Sensing III - Study of CaF 2 samples using DUV birefringence measurement and x-ray diffraction techniques
Shaw, Joseph A., Wang, Baoliang, Rosch, William, Tyo, J. ScottVolume:
6682
Year:
2007
Language:
english
DOI:
10.1117/12.735086
File:
PDF, 573 KB
english, 2007