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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Gallium Nitride Materials and Devices III - Structural defects and degradation of high-power pure-blue GaN-based laser diodes
Morkoç, Hadis, Tomiya, Shigetaka, Goto, Osamu, Litton, Cole W., Chyi, Jen-Inn, Ikeda, Masao, Nanishi, Yasushi, Yoon, EuijoonVolume:
6894
Year:
2008
Language:
english
DOI:
10.1117/12.767769
File:
PDF, 1.46 MB
english, 2008