SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Metamaterials: Fundamentals and Applications II - A study of the image quality in a lossy NFSL
Noginov, Mikhail A., Lee, Kwangchil, Kim, Kyoungsik, Zheludev, Nikolay I., Boardman, Allan D., Engheta, NaderVolume:
7392
Year:
2009
Language:
english
DOI:
10.1117/12.826796
File:
PDF, 319 KB
english, 2009