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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Distortion measurement and calibration technology research of automatic observing and aiming optical system based on CCD
Yu, Xun, Zhang, Yudong, Wyant, James C., Li, Qian, Shang, Xiao-yan, Smythe, Robert A., Wang, Hexin, Nie, Liang, Wu, Ji-anVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828656
File:
PDF, 359 KB
english, 2008