SPIE Proceedings [SPIE Nano-Design, Technology, Computer Simulations - Minsk, Belarus (Monday 23 June 2008)] Twelfth International Workshop on Nanodesign Technology and Computer Simulations - Modeling of defects in wide-gap semiconductors using cluster approach
Gurskii, Alexander L., Melker, Alexander I., Nelayev, Vladislav V.Volume:
7377
Year:
2008
Language:
english
DOI:
10.1117/12.837009
File:
PDF, 587 KB
english, 2008