SPIE Proceedings [SPIE Second International Conference on Smart Materials and Nanotechnology in Engineering - Weihai, China (Wednesday 8 July 2009)] Second International Conference on Smart Materials and Nanotechnology in Engineering - Full-field measurement of dynamic stress by mechanoluminescence sensing film
Li, Chenshu, Leng, Jinsong, Asundi, Anand K., Xu, Chao-Nan, Imai, Yusuke, Ecke, Wolfgang, Bu, NanVolume:
7493
Year:
2009
Language:
english
DOI:
10.1117/12.845577
File:
PDF, 2.48 MB
english, 2009