![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII - Characterization of secondary phases and other defects in CdZnTe
Duff, Martine C., Burger, Arnold, Franks, Larry A., Lynn, Kelvin G., Jones, Kelly, James, Ralph B., Soundararajan, Rajeswari, Bradley, John P., Ishii, Hope, Aguiar, Jeffery, Wozniakiewicz, PennyVolume:
7805
Year:
2010
Language:
english
DOI:
10.1117/12.862379
File:
PDF, 6.14 MB
english, 2010