SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Evaluation of the usage of a fiber optic low-coherence interferometer for surface profile measurements using speckles analysis
Schmitt, Robert, Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Mallmann, GuilhermeVolume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870754
File:
PDF, 9.24 MB
english, 2010