SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Characterization and source identification of fugitive dusts by light and electron microscopy
Brown, Richard S., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel, Tim K.Volume:
8036
Year:
2011
Language:
english
DOI:
10.1117/12.885022
File:
PDF, 19.96 MB
english, 2011