SPIE Proceedings [SPIE 1983 Technical Symposium East -...

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SPIE Proceedings [SPIE 1983 Technical Symposium East - Arlington (Tuesday 5 April 1983)] Applications of Optical Metrology: Techniques and Measurements II - Self-Calibrating Cavity Radiometers At The Eppley Laboratory:Capabilities And Applications

Karoli, Alton R., Hickey, John R., Frieden, Roger G., Lee, Jar J.
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Volume:
416
Year:
1983
Language:
english
DOI:
10.1117/12.935917
File:
PDF, 298 KB
english, 1983
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