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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] Optical Thin Films II: New Developments - Quantitative Analysis Of Thin Film Morphology Evolution
Yehoda, Joseph E., Messier, Russell, Seddon, Richard I.Volume:
678
Year:
1986
Language:
english
DOI:
10.1117/12.939536
File:
PDF, 9.84 MB
english, 1986