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SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optomechanical and Electro-Optical Design of Industrial Systems - Optical Inspection In Hostile Industrial Environments: Single-Sensor VS. Imaging Methods
Cielo, P., Dufour, M., Sokalski, A., Bieringer, Robert J., Harding, Kevin G.Volume:
959
Year:
1988
Language:
english
DOI:
10.1117/12.947779
File:
PDF, 20.70 MB
english, 1988