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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Applications of Digital Image Processing XI - Edge Detection In Cytology Using Local Statistical Properties.
Barba, Joseph, Fenster, Paul, Jeanty, Henrick, Gil, Joan, Tescher, Andrew G.Volume:
974
Year:
1988
Language:
english
DOI:
10.1117/12.948480
File:
PDF, 10.81 MB
english, 1988