Effect of Diffused B During Annealing on the Electronic...

Applied Physics Express 2012 / 2 Vol. 5; Iss. 3

Effect of Diffused B During Annealing on the Electronic Structure of the MgO Barrier in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions

Han, Yoonsung, Han, Jinhee, Choi, Hyoung Joon, Shin, Hyun-Joon, Hong, Jongill
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/APEX.5.033001
Date:
February, 2012
File:
PDF, 528 KB
english, 2012
Conversion to is in progress
Conversion to is failed