Long-term Reliability Prediction of 935 nm LEDs Using...

Quality and Reliability Engineering International 2005 Vol. 21; Iss. 6

Long-term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests

Y. Deshayes, L. Bechou, F. Verdier, Y. Danto
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
21
Year:
2005
Language:
english
Pages:
24
DOI:
10.1002/qre.670
File:
PDF, 611 KB
english, 2005
Conversion to is in progress
Conversion to is failed