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SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Three-dimensional inspection of integrated circuits: a depth from focus approach
Binefa, Xavier, Vitria, Jordi M., Villanueva, Juan J., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.Volume:
1661
Year:
1992
Language:
english
DOI:
10.1117/12.130302
File:
PDF, 276 KB
english, 1992