![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photoelectronic Detection and Imaging: Technology and Applications '93 - Beijing, China (Monday 17 May 1993)] Photoelectronic Detection and Imaging: Technology and Applications '93 - Detecting defects and showing their position in a deep hole by means of CCD camera
Liu, Muxing, Liu, Zhenying, Mi, Qian, Su, Binghua, Zhou, LiWeiVolume:
1982
Year:
1993
Language:
english
DOI:
10.1117/12.142040
File:
PDF, 358 KB
english, 1993