SPIE Proceedings [SPIE Thin Film Physics and Applications: Second International Conference - Shanghai, China (Friday 15 April 1994)] Second International Conference on Thin Film Physics and Applications - Structure and characteristic of porous silicon layer
Wei, Guang-Pu, Feng, Jingwei, Zheng, Yiming, Li, Yu, Zhou, Shixun, Wang, Yongling, Chen, Yi-Xin, Mao, ShuzhengVolume:
2364
Year:
1994
Language:
english
DOI:
10.1117/12.190741
File:
PDF, 285 KB
english, 1994