SPIE Proceedings [SPIE ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging - Beijing, China (Tuesday 25 June 2013)] International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications - Characterization of single photon avalanche diodes fabricated by 0.13μm CMOS technology
Guo, Jiayu, Chen, Chuyu, Feng, Liang, Pu, Xiaofeng, Ji, Xiaoli, Yan, Feng, Ohta, Jun, Wu, Nanjian, Li, BinqiaoVolume:
8908
Year:
2013
Language:
english
DOI:
10.1117/12.2034784
File:
PDF, 360 KB
english, 2013