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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Development of split-delay x-ray optics using Si(220) crystals at SACLA
Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, Osaka, Taito, Hirano, Takashi, Yabashi, Makina, Sano, Yasuhisa, Tono, Kensuke, Inubushi, Yuichi, Sato, Takahiro, Ogawa, Kanade, Matsuyama, SaVolume:
9210
Year:
2014
Language:
english
DOI:
10.1117/12.2060238
File:
PDF, 1.69 MB
english, 2014