SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Matching method of the vision image captured by the lunar rover exploring on lunar surface
Han, Sen, Yoshizawa, Toru, Zhang, Song, Li, Lichun, Zhou, Jianliang, Sun, Jun, Shang, Desheng, Xu, Yinghui, Zhang, Wei, Wan, WenhuiVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2073717
File:
PDF, 672 KB
english, 2014