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SPIE Proceedings [SPIE High-Speed Electronics and Device Scaling - San Diego, United States (Sunday 18 March 1990)] High-Speed Electronics and Device Scaling - Resonant-tunneling diode stability and its consequences for high-frequency operation
Kidner, Curtis, Mehdi, Imran, East, Jack R., Haddad, George I., Eastman, Lester F.Volume:
1288
Year:
1990
Language:
english
DOI:
10.1117/12.20915
File:
PDF, 314 KB
english, 1990