SPIE Proceedings [SPIE International Conference on Intelligent Manufacturing - Wuhan, China (Saturday 10 June 1995)] International Conference on Intelligent Manufacturing - Feature-based part representation in a CIM environment
Zeng, Xianglin, Wang, Qifu, Huang, Zhengdong, Zhou, Ji, Yang, Shuzi, Zhou, Ji, Li, Cheng-GangVolume:
2620
Year:
1995
Language:
english
DOI:
10.1117/12.217498
File:
PDF, 218 KB
english, 1995