SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Compensation detector of birefringence
Shribak, Michael I., Kolpashchikov, Victor L., Yoshizawa, Toru, Yokota, HideshiVolume:
2873
Year:
1996
Language:
english
DOI:
10.1117/12.246251
File:
PDF, 86 KB
english, 1996