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SPIE Proceedings [SPIE Photonics East '96 - Boston, MA (Monday 18 November 1996)] Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II - Image quality in laser-diode-based diffractive scanning systems
Kilgus, Donald B., Svetkoff, Donald J., LaCosse, Jason A., Harding, Kevin G., Svetkoff, Donald J.Volume:
2909
Year:
1997
Language:
english
DOI:
10.1117/12.263324
File:
PDF, 640 KB
english, 1997