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SPIE Proceedings [SPIE Intelligent Systems & Advanced Manufacturing - Pittsburgh, PA (Tuesday 14 October 1997)] Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III - Extraction of features from 3D laser scanner cloud data
Chan, Vincent H., Bradley, Colin H., Vickers, Geoffrey W., Harding, Kevin G., Svetkoff, Donald J.Volume:
3204
Year:
1997
DOI:
10.1117/12.294457
File:
PDF, 783 KB
1997