SPIE Proceedings [SPIE Third International Conference on Thin Film Physics and Applications - Shanghai, China (Tuesday 15 April 1997)] Third International Conference on Thin Film Physics and Applications - Relationship between resistivity and temperature for Hg1-xCdxTe photoconductive detectors
Gui, Yongsheng, Zheng, Guozhen, Zhang, X. C., Guo, Shaoling, Chu, Junhao, Cai, Yi, Zhou, Shixun, Wang, Yongling, Chen, Yi-Xin, Mao, ShuzhengVolume:
3175
Year:
1998
DOI:
10.1117/12.300710
File:
PDF, 404 KB
1998