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SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Machine Vision Systems for Inspection and Metrology VII - Online inspection and accuracy analysis for parts using neural networks
Xiong, Yingen, Zhang, Guangzhao, Batchelor, Bruce G., Miller, John W. V., Solomon, Susan S.Volume:
3521
Year:
1998
Language:
english
DOI:
10.1117/12.326958
File:
PDF, 1.37 MB
english, 1998