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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - Experimental studies of scatter-probe near-field optical microscopy
Zavala Ortiz, Saul A., Negrete-Regagnon, Pedro, Mendez, Eugenio R., Gu, Zu-Han, Maradudin, Alexei A.Volume:
3426
Year:
1998
Language:
english
DOI:
10.1117/12.328442
File:
PDF, 327 KB
english, 1998