SPIE Proceedings [SPIE Photonics East '99 - Boston, MA (Sunday 19 September 1999)] Environmental Monitoring and Remediation Technologies II - Atomic spectrometry in environmental monitoring and process control
Mermet, Jean-Michel, Vo-Dinh, Tuan, Spellicy, Robert L.Volume:
3853
Year:
1999
Language:
english
DOI:
10.1117/12.372842
File:
PDF, 408 KB
english, 1999