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SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI - Automatic characterization of electro-optical sensors with image processing using the triangle orientation discrimination (TOD) method
de Lange, Dirk-Jan, Valeton, J. M., Bijl, Piet, Holst, Gerald C.Volume:
4030
Year:
2000
Language:
english
DOI:
10.1117/12.391770
File:
PDF, 927 KB
english, 2000